Epsilon 3XLE Benchtop EDXRF Spectrometer
Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.
|Sample handling||X-ray tube||Detector|
|10-position removable sample changer||Metal-ceramic side window||Typically 135 eV|
|Accommodates 25 to 52 mm diameter samples||50 Micrometer thin window (Be)||SDDUltra|
|Spinner included||Software controlled, max. voltage 50 kV, max. 3 mA, max. 15 W||High-resolution silicon drift with ultra thin window|