A Product by Panalytical

Epsilon 3XLE Benchtop EDXRF Spectrometer

Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.

Sample handlingX-ray tubeDetector
10-position removable sample changerMetal-ceramic side windowTypically 135 eV
Accommodates 25 to 52 mm diameter samples50 Micrometer thin window (Be)SDDUltra
Spinner includedSoftware controlled, max. voltage 50 kV, max. 3 mA, max. 15 WHigh-resolution silicon drift with ultra thin window